Characterization of a Jian‐like sherd with the optical microscope, confocal Raman, wavelength‐dispersive X‐ray fluorescence, and portable XRF spectrometers

Autor:	Suat Yilmaz, Ahmet Nejat Birdevrim, Tugce Akkas, Sinem Yildirim, Gulsu Simsek Franci
Rok vydání:	2020
Předmět:	Materials science Spectrometer business.industry Confocal X-ray fluorescence law.invention Characterization (materials science) symbols.namesake Wavelength Optics Optical microscope law Sherd symbols General Materials Science Raman spectroscopy business Spectroscopy
Zdroj:	Journal of Raman Spectroscopy. 51:1343-1352
ISSN:	1097-4555 0377-0486
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::7bfa795d0bb97b91b12b89adf3f21b75 https://doi.org/10.1002/jrs.5904 Zobrazit plný text záznamu Plný text