Investigation of Dose and Dose Rate Sensitivity of RADFETs in Space Environment

Autor:	Elizaveta V. Mrozovskaya, Gennady I. Zebrev, Pavel A. Chubunov
Rok vydání:	2020
Předmět:	Materials science Optics law business.industry Logic gate Transistor Low dose Sensitivity (control systems) Dose rate business law.invention Space environment Ionizing radiation
Zdroj:	2020 Moscow Workshop on Electronic and Networking Technologies (MWENT).
DOI:	10.1109/mwent47943.2020.9067469
Popis:	It was shown that there are low-dose-rate effects in the MNOS-structure, and that the compact model can successfully describe them. A new method was proposed for calibrating the on-board equipment for monitoring the accumulated dose of ionizing radiation in outer space, characterized in that it takes into account the effect of low dose rates, which makes it possible to select more dose-sensitive structures as sensitive elements, and thereby increase the accuracy of the device.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::7bb7dd21b23e670cb64808090fe07647 https://doi.org/10.1109/mwent47943.2020.9067469 Zobrazit plný text záznamu