Homogeneously Aligned Liquid Crystals on a ZrO2Alignment Film Using Ion-Beam Irradiation
| Autor: | Lee Gon Kim, Jinwoo Lee, Seok Jeong Yang, Young Gu Kang, Hong Gyu Park, Dae Shik Seo |
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| Rok vydání: | 2012 |
| Předmět: |
Materials science
Zirconium dioxide Ion beam Analytical chemistry Sputter deposition Condensed Matter Physics Electronic Optical and Magnetic Materials Contact angle chemistry.chemical_compound symbols.namesake chemistry X-ray photoelectron spectroscopy Liquid crystal symbols van der Waals force Thin film |
| Zdroj: | Ferroelectrics. 431:176-182 |
| ISSN: | 1563-5112 0015-0193 |
| DOI: | 10.1080/00150193.2012.684989 |
| Popis: | This paper introduces the characteristics of the zirconium dioxide (ZrO2) inorganic film deposited by radio-frequency magnetron sputtering. The homogeneously aligned liquid crystal (LC) on ZrO2 layer via ion beam (IB) irradiation at various incident angles was embodied with LC alignment capability and performance. The x-ray photoelectron spectroscopic (XPS) data shows that O-Zr bonds on the ZrO2 surface are broken and induce the van der Waals force for the homogeneous alignment of LCs. That is the van der Waals force, affecting the alignment of the LCs, is verified by the contact angle of the liquid and by the XPS analysis on the ZrO2 thin film. In addition, the advantage of IB alignment method is verified by using atomic force microscope (AFM). |
| Databáze: | OpenAIRE |
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