Tof-SIMS studies on chlorhexidine and its reaction products with sodium hypochlorite to ascertain decomposition products

Autor: Edward D. Fillery, Bettina Basrani, Rana N.S. Sodhi, Sheela Manek
Rok vydání: 2010
Předmět:
Zdroj: Surface and Interface Analysis. 43:591-594
ISSN: 0142-2421
DOI: 10.1002/sia.3432
Popis: The combination of sodium hypochlorite (NaOCl) and Chlorhexidine (CHX), results in the formation of a precipitate. Previous studies have been conducted to find at which concentrations the precipitate appeared and its identity. One postulate is that when CHX breaks down that one of its products is the toxic para-chloroaniline. Both X-Ray photoelectron spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry have been used to qualify and quantify the precipitation. A problem that exists with both techniques is that the breakdown components are likely to show similar functionalities/fragments as those in CHX. Thus the presence of the breakdown components can only be surmised. For example, CHX shows peaks at 127, 153, 170 and 195 in the positive ToF-SIMS spectrum corresponding to various molecular fragments from the parent CHX molecule arising from the breaking of the various C to N bonds. However, the major peak for chloroaniline is also that at 127. The positive ToF-SIMS spectrum of the precipitate (after DI-water wash) shows these fragments as well as a peak at 111 correlating with the NaOCl concentration. However, importantly, there is no evidence of the CHX parent ion on the precipitate which is present in the mass spectrum of CHX. This suggests that the fragments shown in the precipitate mass spectrum do arise from the breakdown components. This is further confirmed by mass spectra taken of the cooled precipitate and also from immiscible liquids present in the DI-water wash solution, which showed a large increase in the peak intensity at mass 127. Copyright © 2010 John Wiley & Sons, Ltd.
Databáze: OpenAIRE