Non-contact atomic force microscopy of an antiferromagnetic NiO(100) surface using a ferromagnetic tip
| Autor: | Hirotaka Hosoi, Kazunobu Hayakawa, K. Mukasa, M. Kimura, Kazuhisa Sueoka |
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| Rok vydání: | 2001 |
| Předmět: |
Kelvin probe force microscope
Chemistry Scanning electron microscope Analytical chemistry Scanning ion-conductance microscopy General Materials Science General Chemistry Conductive atomic force microscopy Scanning capacitance microscopy Magnetic force microscope Non-contact atomic force microscopy Photoconductive atomic force microscopy |
| Zdroj: | Applied Physics A. 72:S23-S26 |
| ISSN: | 1432-0630 0947-8396 |
| DOI: | 10.1007/s003390100722 |
| Popis: | We have observed a cleaved NiO(100) surface by means of non-contact atomic force microscopy (NC-AFM) using a Fe-coated tip. The shape and magnetic properties of the Fe-coated tip are confirmed by ex situ scanning electron microscopy (SEM) and magnetic force microscopy (MFM) imaging. Also, in situ Δf–vmeasurement shows that the contact-potential difference (CPD) is different between non-coated Si and Fe-coated tips. The Fe-coated tip can produce atomically resolved NC-AFM images of a cleaved NiO(100) surface at room temperature. |
| Databáze: | OpenAIRE |
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