Structural defects in self‐assembled organic monolayers via combined atomic beam and x‐ray diffraction

Autor:	N. Camillone, Christopher E. D. Chidsey, Paul Fenter, K. S. Liang, Gang-yu Liu, Jun Li, P. Eisenberger, Giacinto Scoles
Rok vydání:	1993
Předmět:	Diffraction business.industry General Physics and Astronomy chemistry.chemical_element Crystallographic defect Crystallography Laser linewidth Optics chemistry Atom Monolayer X-ray crystallography Molecule Physical and Theoretical Chemistry business Helium
Zdroj:	The Journal of Chemical Physics. 99:744-747
ISSN:	1089-7690 0021-9606
DOI:	10.1063/1.465749
Popis:	We present the results of a combined He atom and x‐ray diffraction study of CH3(CH2)n−1SH monolayers self assembled on Au(111) surfaces. By combining these two complementary probes, we have characterized both the surface and the interior structure of the monolayers. In both cases, we find the same structure containing four molecules per unit mesh. However, we demonstrate that there are significant differences in both the diffraction linewidths and the dependence of the linewidth upon chain length for these two techniques.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::7b731d8e38df06a3603b9c45591eb109 https://doi.org/10.1063/1.465749 Zobrazit plný text záznamu