Hybrid BIST optimization using reseeding and test set compaction
| Autor: | E. Orasson, Helena Kruus, Raimund Ubar, Gert Jervan |
|---|---|
| Rok vydání: | 2008 |
| Předmět: |
Pseudorandom number generator
Computer Networks and Communications Computer science Test compression Hardware_PERFORMANCEANDRELIABILITY Parallel computing Test (assessment) Artificial Intelligence Hardware and Architecture Test set Fault coverage Algorithm Software Shift register Test set compaction |
| Zdroj: | Microprocessors and Microsystems. 32:254-262 |
| ISSN: | 0141-9331 |
| DOI: | 10.1016/j.micpro.2008.03.007 |
| Popis: | Classical built-in self-test (BIST) approaches are largely based on pseudorandom testing, and using linear feedback shift registers (LFSR) for test set generation and test response compaction. In this paper, we are concentrating on one possible extension of the classical BIST, namely hybrid BIST, where pseudorandom test patterns are complemented with pre-computed deterministic test patterns to increase the fault coverage and to reduce test time. We will propose a novel method for hybrid BIST optimization, based on reseeding and test set compaction. The objective is to minimize the test time at given test memory constraints, without losing test quality. We will compare the proposed method with hybrid BIST methods developed earlier and analyze its suitability for testing core-based systems. |
| Databáze: | OpenAIRE |
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