Ellipsometry in the Study of Dynamic Material Properties

Autor: William W. Anderson, Stefanie L. Montgomery, Steve K. Lamoreaux, Konstantinos Boboridis, A. W. Obst, Mark D. Wilke, K. R. Alrick, Bruce R. Marshall, William T. Buttler, J. R. Payton
Rok vydání: 2002
Předmět:
Zdroj: AIP Conference Proceedings.
ISSN: 0094-243X
DOI: 10.1063/1.1483765
Popis: Measurements of the time-dependent absolute temperature of surfaces shocked using high explosives (HE) provide valuable constraints on the equations-of-state (EOS) of materials and on the state of ejecta from those surfaces. In support of these dynamic surface temperature measurements, techniques for measuring the dynamic surface emissivity of shocked metals in the near infrared (IR) are being developed. These consist of time-dependent laser ellipsometric measurements, using several approaches. A discussion of these ellipsometric techniques is included here. Ellipsometry permits an accurate determination of the dynamic emissivity at a given wavelength, and may also provide a signature of melt in shocked metals.
Databáze: OpenAIRE