Stigmatic high-resolution high-throughput narrow-band diffraction spectrograph employing X-ray multilayer mirrors

Autor:	Anatoli I. Fedorenko, S. A. Yulin, Mikhail M. Mitropolsky, Nikolai N. Kolachevsky, Eugene N. Ragozin, V. V. Kondratenko
Rok vydání:	1993
Předmět:	Physics Diffraction business.industry Resonance Grating Condensed Matter Physics Atomic and Molecular Physics and Optics Optics Reflection (physics) Stigmatism Spectral resolution Spectroscopy business Spectrograph Mathematical Physics
Zdroj:	Physica Scripta. 47:495-500
ISSN:	1402-4896 0031-8949
DOI:	10.1088/0031-8949/47/4/004
Popis:	We report the implementation of a novel diffraction spectroscopic instrument comprising two focusing multilayer mirrors at near-normal incidence and a conventional blazed plane grating at grazing incidence. The nearly perfect stigmatism and the theoretical resolving power above 6 × 104 are due to the separation of the focusing and dispersing functions. For higher throughput, two multilayer mirrors with nearly identical resonance reflection curves around λ0 135 A have been synthesized employing a magnetron ion-sputtering source. The instrument performance has been assessed using a laser-plasma radiation source. The spectral resolution in excess of 4 × 103 and the applicability to space-resolved spectroscopy and plasma diagnosis have been demonstrated.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::7b0fb21738880db1e523daa7d6bef4d1 https://doi.org/10.1088/0031-8949/47/4/004 Zobrazit plný text záznamu