Applying a combination of laboratory X-Ray diffraction and digital image correlation for recording uniaxial stress-strain curves in thin surface layers
| Autor: | Matthew S. Blackmur, Michael Preuss, Albert D. Smith, Keith Wilford, Stuart Morse, Gary Harrison, John E. Warren |
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| Rok vydání: | 2020 |
| Předmět: |
Diffraction
Digital image correlation Materials science business.industry Mechanical Engineering Stress–strain curve Peening 02 engineering and technology 021001 nanoscience & nanotechnology Condensed Matter Physics Stress (mechanics) 020303 mechanical engineering & transports Optics 0203 mechanical engineering Mechanics of Materials Ultimate tensile strength X-ray crystallography General Materials Science 0210 nano-technology business Civil and Structural Engineering Test data |
| Zdroj: | International Journal of Mechanical Sciences. 183:105731 |
| ISSN: | 0020-7403 |
| DOI: | 10.1016/j.ijmecsci.2020.105731 |
| Popis: | By combining laboratory-based x-ray diffraction stress analysis with optical digital image correlation recorded in-situ during tensile loading, a new methodology has been developed to obtain for surface specific stress-strain curves. This novel methodology has been validated by comparing the reconstructed stress-strain curves from the x-ray diffraction/optical digital image correlation approach with stress-strain curves recorded using standard methods. The validated methodology enables now the recording of standard mechanical test data of altered surface layers, such as shot peened and machined surfaces or from proton-irradiated samples where the irradiated layer is limited to a depth of 10 s of microns. |
| Databáze: | OpenAIRE |
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