| Autor: |
Weijun Liu, Qin Xi Xie, Shixin Yuan, Jing-Bing Zhu, Pulin Liu, Li He, Guo Liang Shi |
| Rok vydání: |
1991 |
| Předmět: |
|
| Zdroj: |
International Conference on Thin Film Physics and Applications. |
| ISSN: |
0277-786X |
| Popis: |
The IR transmission spectra for HgCdTe/CdTe/GaAs multilayers grown by molecular-beam epitaxy were measured in the wavenumber region of 600 cm -1 - 4000 cm -1 at 300 K and 77 K. The transmission spectra were calculated taking the thickness d 1 of MCT layer and the thickness d 2 of CdTe layer as fitting parameters in the energy range from 600 cm -1 to 300 cm -1 below the energy gap Eg assuming the existence of abrupt interfaces between the neighboring layers. The values of d 1 and d 2 obtained by fitting the IR transmission spectra are in good agreement with that by transmission electron microscopy (TEM) measurement. The accurate absorption coefficient spectra were obtained and discussed in the energy region equivalent to 0.9 Eg to 4000 cm -1 taking into account the interference effects. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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