An improved temperature dependent analytical model to predict AlGaN/GaN high electron mobility transistors AC characteristics

Autor: Mohammad N. Khan, Muhammad Mansoor Ahmed, Saif Rehman, U. F. Ahmed
Rok vydání: 2019
Předmět:
Zdroj: International Journal of Numerical Modelling: Electronic Networks, Devices and Fields. 32
ISSN: 1099-1204
0894-3370
Databáze: OpenAIRE