An improved temperature dependent analytical model to predict AlGaN/GaN high electron mobility transistors AC characteristics
Autor: | Mohammad N. Khan, Muhammad Mansoor Ahmed, Saif Rehman, U. F. Ahmed |
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Rok vydání: | 2019 |
Předmět: | |
Zdroj: | International Journal of Numerical Modelling: Electronic Networks, Devices and Fields. 32 |
ISSN: | 1099-1204 0894-3370 |
Databáze: | OpenAIRE |
Externí odkaz: |