Single layer and multilayer tip coatings in magnetic force microscopy

Autor:	S. M. Casey, David B. Lambrick, P.J. Grundy, M.A Slade, D. G. Lord
Rok vydání:	1999
Předmět:	Materials science Magnetic structure Magnetometer Alloy Analytical chemistry General Physics and Astronomy engineering.material Epitaxy Microstructure law.invention Lift (force) Condensed Matter::Materials Science Coating law engineering Magnetic force microscope Composite material
Zdroj:	Journal of Applied Physics. 85:5166-5168
ISSN:	1089-7550 0021-8979
DOI:	10.1063/1.369112
Popis:	Interactions between the imaging tip and the sample in magnetic force microscopy (MFM) have been investigated by studying the magnetic microstructure of a range of epitaxial garnet films. Etched silicon cantilever probes, coated with CoPt alloy films and Co/Pt multilayers, provided a range of MFM probes for this study. Resonant torque magnetometry was used to characterize their magnetic properties. Phase change images were found to vary considerably in terms of relative “domain volumes” at the surface depending on which probe was used. Decreasing the moment of the alloy coated tips by using thinner layers reduces the “magnetizing” interaction of the tip field but also reduced the signal to noise ratio. By coating the tip with a multilayer a good signal to noise ratio could be obtained with very little interaction. Force–distance curves were used to study the response of the tips at various lift heights. The tips coated with alloy films gave a significant decrease in signal to noise ratio as the lift heigh...
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::7a85c370cfdf822cff15b4bf433501d6 https://doi.org/10.1063/1.369112 Zobrazit plný text záznamu