Secondary electron emission by multiply charged ions and its magnitude in vacuum arcs
| Autor: | J C Sherman |
|---|---|
| Rok vydání: | 1977 |
| Předmět: |
Acoustics and Ultrasonics
Chemistry Electron multiplier Alloy engineering.material Condensed Matter Physics Kinetic energy Secondary electrons Surfaces Coatings and Films Electronic Optical and Magnetic Materials Ion Metal Physics::Plasma Physics visual_art Secondary emission visual_art.visual_art_medium engineering Ionization energy Atomic physics |
| Zdroj: | Journal of Physics D: Applied Physics. 10:355-359 |
| ISSN: | 1361-6463 0022-3727 |
| DOI: | 10.1088/0022-3727/10/3/015 |
| Popis: | The emission of secondary electrons from atomically clean metal surfaces due to bombardment by singly and multiply charged ions is considered. Attention is restricted to ion kinetic energies of less than several hundred eV and molecular ions and alloy surfaces are both excluded. Previous measurements of the secondary electron emission coefficient gamma are used to derive an empirical relationship between gamma , the ionization energy of the ion and the work-function of the surface. This relationship is presented graphically and is more precise for multiply charged than for singly charged ions. It is proposed that the relationship is applicable to any combination of atomic ion and pure metal surface. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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