Scanning Tunneling Microscopy Detection of Surface Spin-Polarized Electron Accumulations in Topological Insulators
| Autor: | Michael Dreyer, R. E. Butera, Adam L. Friedman, Isaak D. Mayergoyz, David Bowen, Patrick J. Taylor, Siddharth Tyagi, Charlie Krafft, Dan Hinkel |
|---|---|
| Rok vydání: | 2021 |
| Předmět: |
Materials science
Condensed matter physics chemistry.chemical_element Biasing 02 engineering and technology Electron Tungsten 021001 nanoscience & nanotechnology 01 natural sciences Electronic Optical and Magnetic Materials law.invention Condensed Matter::Materials Science chemistry.chemical_compound chemistry law Topological insulator 0103 physical sciences Condensed Matter::Strongly Correlated Electrons Bismuth selenide Scanning tunneling microscope 010306 general physics 0210 nano-technology Spin (physics) Quantum tunnelling |
| Zdroj: | IEEE Magnetics Letters. 12:1-4 |
| ISSN: | 1949-3088 1949-307X |
| Popis: | Spin-momentum locking in the surface mode of topological insulators leads to the surface accumulations of spin-polarized electrons caused by bias currents through topological insulator samples. It is demonstrated in this letter that surface spin-polarized electron accumulations caused by the above bias currents can be sensed by using scanning tunneling microscopy. The experimental results of this sensing are presented for tin-doped bismuth selenide samples by employing iron-coated tungsten tips as well as nonmagnetic tungsten tips. A linear increase in the spin accumulation as a function of bias current through topological insulator samples is observed. |
| Databáze: | OpenAIRE |
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