Highly Sensitive Electrostatic Force Detection Using Small Amplitude Frequency-Modulation Atomic Force Microscopy in the Second Flexural Mode
| Autor: | Yoshihiro Hosokawa, Kei Kobayashi, Kazumi Matsushige, Hirofumi Yamada, Keisuke Nishi |
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| Rok vydání: | 2011 |
| Předmět: |
Kelvin probe force microscope
business.industry Chemistry Electrostatic force microscope Atomic force acoustic microscopy Bioengineering Surfaces and Interfaces Scanning capacitance microscopy Conductive atomic force microscopy Nanoindentation Condensed Matter Physics Molecular physics Surfaces Coatings and Films Optics Piezoresponse force microscopy Mechanics of Materials business Non-contact atomic force microscopy Biotechnology |
| Zdroj: | e-Journal of Surface Science and Nanotechnology. 9:146-152 |
| ISSN: | 1348-0391 |
| DOI: | 10.1380/ejssnt.2011.146 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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