Thick silicon strip detector Compton imager
| Autor: | James D. Kurfess, W. N. Johnson, Eric A. Wulf, E.I. Novikova, Bernard F. Phlips |
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| Rok vydání: | 2004 |
| Předmět: |
Physics
Nuclear and High Energy Physics Silicon Physics::Instrumentation and Detectors business.industry Astrophysics::High Energy Astrophysical Phenomena Gamma ray Compton scattering chemistry.chemical_element Gamma-ray astronomy Spectral line Full width at half maximum Optics Nuclear Energy and Engineering chemistry Angular resolution Electrical and Electronic Engineering business Doppler broadening |
| Zdroj: | IEEE Transactions on Nuclear Science. 51:1997-2003 |
| ISSN: | 0018-9499 |
| Popis: | We present results obtained with double-sided, thick (2 mm) silicon strip detectors used as a Compton imager. Reconstructed images and spectra from /sup 137/Cs and /sup 60/Co gamma-ray sources have been produced at room temperature using the multiple Compton technique. Multiple Compton interactions allow the energy and Compton scattering angle to be reconstructed without having to absorb the energy of the incident gamma ray completely. This extends our work on multiple Compton imagers using germanium strip detectors to silicon detectors that operate at higher temperatures. The energy resolution of the detectors for 60 keV gamma rays is 3-4 keV at room temperature and 2.1 keV at -20/spl deg/C. Simulations of the imager have been performed in GEANT4, including Doppler broadening and accidental coincidences, and show agreement with the measured data. Reconstructing the energy spectrum for 662 keV gamma rays that did not deposit their full energy in the instrument shows a peak at 662 keV with a full-width at half-maximum (FWHM) of 27.6 keV. The reconstructed image of the source shows an angular resolution of 3.3/spl deg/ FWHM. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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