5‐3: Experimental and Physics‐Based Analysis of Leakage Currents for LTPS TFTs in AMOLED Displays

Autor:	Dokyeong Lee, Jae-Seob Lee, Meejae Kang, Han-Bit Kim, Yongsu Lee, Jin-Oh Kwag, Tae-Wook Kang, Bummo Sung, Hyeyong Chu, Changhee Lee, Kim Doo-Na, Chu Jae-Hwan, Kwak Hye-Na, Tien Nguyen Thanh, Sangsub Kim, Keunwoo Kim
Rok vydání:	2021
Předmět:	Materials science AMOLED business.industry Optoelectronics Physics based business Leakage (electronics)
Zdroj:	SID Symposium Digest of Technical Papers. 52:37-40
ISSN:	2168-0159 0097-966X
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::79b11a5f475d70710453649c729888d4 https://doi.org/10.1002/sdtp.14604 Zobrazit plný text záznamu Plný text