Advanced DFM application for automated bit-line pattern dummy

Autor: Cheol-Kyun Kim, Mohamed H. Bahr, Hyunjo Yang, Tae Hyun Shin
Rok vydání: 2016
Předmět:
Zdroj: SPIE Proceedings.
ISSN: 0277-786X
DOI: 10.1117/12.2220276
Popis: This paper presents an automated DFM solution to generate Bit Line Pattern Dummy (BLPD) for memory devices. Dummy shapes are aligned with memory functional bits to ensure uniform and reliable memory device. This paper will present a smarter approach that uses an analysis based technique for adding the dummy shapes that have different types according to the space available. Experimental results based on layout of Mobile dynamic random access memory (DRAM).
Databáze: OpenAIRE