High-frequency dielectric measurements
| Autor: | Michael Janezic, James R. Baker-Jarvis, Donald C. DeGroot |
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| Rok vydání: | 2010 |
| Předmět: | |
| Zdroj: | IEEE Instrumentation & Measurement Magazine. 13:24-31 |
| ISSN: | 1941-0123 1094-6969 |
| DOI: | 10.1109/mim.2010.5438334 |
| Popis: | The demands on dielectric material measurements have increased over the years as electrical components have been miniaturized and device frequency bands have increased. Well-characterized dielectric measurements on thin materials are needed for circuit design, minimization of crosstalk, and characterization of signal-propagation speed. Bulk material applications have also increased. For accurate dielectric measurements, each measurement band and material geometry requires specific fixtures. Engineers and researchers must carefully match their material system and uncertainty requirements to the best available measurement system. Broadband measurements require transmission-line methods, and accurate measurements on low-loss materials are performed in resonators. The development of the most accurate methods for each application requires accurate fixture selection in terms of field geometry, accurate field models, and precise measurement apparatus. |
| Databáze: | OpenAIRE |
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