Bent-fiber near-field scanning optical microscopy probes for use with commercial atomic force microscopes

Autor:	G. Gurley, Virgil B. Elings, Roderick S. Taylor, Kurt E. Leopold, Mark A. Wendman
Rok vydání:	1997
Předmět:	Materials science Microscope Optical sectioning business.industry Optical engineering Near-field optics Scanning capacitance microscopy law.invention Scanning probe microscopy Optics law Microscopy Near-field scanning optical microscope business
Zdroj:	SPIE Proceedings.
ISSN:	0277-786X
Popis:	The adaptation of a Digital Instruments DimensionTM 3000 atomic-force microscope to provide a near-field scanning optical microscopy capability is described. The enabling technology for the adaptation is the bent optical fiber probe. The design and operation of this probe to measure evanescent fields emerging from optical waveguides is described.© (1997) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::7960b2abbff09e2bb262996ecafa2b05 https://doi.org/10.1117/12.271220 Zobrazit plný text záznamu