Characterization of deep defects in CdS/CdTe thin film solar cells using deep level transient spectroscopy

Autor:	J Versluys
Rok vydání:	2003
Předmět:	Materials Chemistry Metals and Alloys Surfaces and Interfaces Surfaces Coatings and Films Electronic Optical and Magnetic Materials
Zdroj:	Thin Solid Films.
ISSN:	0040-6090
DOI:	10.1016/s0040-6090(03)01512-8
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::790a694bf2653d7e418726b5681da3c5 https://doi.org/10.1016/s0040-6090(03)01512-8 Zobrazit plný text záznamu Full Text from ScienceDirect