Phase-correct bond lengths in crystallineGexSi1−xalloys

Autor:	Z. H. Lu, K. E. Miyano, C. A. King, Joseph C. Woicik, T.-L. Lee, R. W. Johnson, Joseph G. Pellegrino
Rok vydání:	1998
Předmět:	Bond length Crystallography X-ray spectroscopy Materials science Condensed matter physics K-edge Semiconductor materials Coulomb Phase (waves) Absorption (logic)
Zdroj:	Physical Review B. 57:14592-14595
ISSN:	1095-3795 0163-1829
Popis:	Extended x-ray absorption fine structure performed at the Ge K edge has found the Ge-Ge and Ge-Si bond lengths in a series of crystalline Ge{sub x}Si{sub 1{minus}x} alloys (x{le}0.5) to be compositionally dependent. This accurate measurement was made possible by utilizing the {ital experimentally} derived Ge-Si atomic phase shift from the isoelectronic compounds AlAs and GaP. Strain and Coulomb contributions to the bond lengths are also considered. {copyright} {ital 1998} {ital The American Physical Society}
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::78efc0a5a9a1ad98d2bfa8d1a04cb5e1 https://doi.org/10.1103/physrevb.57.14592 Zobrazit plný text záznamu