Application of the optical beam induced current method to the investigation of n-MOS inverters
| Autor: | U. Stamm, K. Hempel, A. Krause, H. Bergner |
|---|---|
| Rok vydání: | 1992 |
| Předmět: |
Materials science
Optical beam-induced current business.industry Analytical chemistry Condensed Matter Physics Optical switch Atomic and Molecular Physics and Optics Computer Science::Other Surfaces Coatings and Films Electronic Optical and Magnetic Materials Test beam Picosecond Computer Science::Multimedia Optoelectronics Inverter Electrical and Electronic Engineering business Resonant inverter |
| Zdroj: | Microelectronic Engineering. 16:521-528 |
| ISSN: | 0167-9317 |
| DOI: | 10.1016/0167-9317(92)90375-2 |
| Popis: | The influence of a pulsed test beam on the OBIC-signal for time-resolved OBIC-measurement at a picosecond time scale on n-MOS inverters is considered. A simple approach of the mechanism of optical switching of a blocked n-MOS inverter is presented. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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