| Popis: |
Magnetic properties of thin magnetic films are strongly affected by the nature of the interface between magnetic and non‐magnetic layers. In spintronic devices the extent to which spins are scattered at an interface depends upon interfacial roughness, alloying, and impurities. We present a polarization‐dependent XAFS study of a 1Pd/9Fe/GaAs(001)‐(4×6) structure grown in situ in the MBE facility at the PNC/XOR, APS. To increase the interfacial roughness, the 1ML Pd was grown on the 9 ML Fe without first sputtering and annealing the Fe. An estimate of interfacial roughness, evidence for formation of Pd islands, their height, and the amount of As floating to the Pd surface from the GaAs are given. |
