Application of excitation cross sections to optical plasma diagnostics

Autor:	John B. Boffard, Charles DeJoseph, Chun C. Lin
Rok vydání:	2004
Předmět:	Acoustics and Ultrasonics Chemistry Plasma parameters Plasma Condensed Matter Physics Surfaces Coatings and Films Electronic Optical and Magnetic Materials Excited state Electron temperature Plasma diagnostics Light emission Emission spectrum Atomic physics Excitation
Zdroj:	Journal of Physics D: Applied Physics. 37:R143-R161
ISSN:	1361-6463 0022-3727
DOI:	10.1088/0022-3727/37/12/r01
Popis:	Many optical-based plasma diagnostic techniques require electron-impact excitation cross sections. In recent years, a considerable number of new results have become available for excitation of rare-gas atoms from both the ground state and metastable states. Using relatively simple techniques these cross sections can be combined with plasma emission measurements to extract many useful plasma parameters such as the electron temperature. Many of the limitations of simple plasma emission models such as the corona model can be overcome by using cross section measurements to select what particular emission lines to use in the analysis.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::78953a12688697485602653bac2833b9 https://doi.org/10.1088/0022-3727/37/12/r01 Zobrazit plný text záznamu