Autor:	G. S. Y. Yeh, P. H. Geil
Rok vydání:	1967
Předmět:	Conventional transmission electron microscope Materials science Reflection high-energy electron diffraction business.industry Mechanical Engineering Optics Electron diffraction Mechanics of Materials biological sciences Scanning transmission electron microscopy health occupations bacteria General Materials Science Selected area diffraction Electron beam-induced deposition business Kikuchi line Electron backscatter diffraction
Zdroj:	Journal of Materials Science. 2:457-469
ISSN:	1573-4803 0022-2461
Popis:	Selected-area small angle electron diffraction using double-condenser electron microscope, noting high resolution power
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::788dbe68e0d109f7619772c6ad58e1d2 https://doi.org/10.1007/bf00562952 Zobrazit plný text záznamu Full text from SpringerLink