Orientation of Few-Layer MoS2 Films: In-Situ X-ray Scattering Study During Sulfurization
Autor: | Eva Majkova, Matej Jergel, Martin Hulman, Peter Nadazdy, Michal Bodík, Peter Siffalovic, Karol Vegso, Peter Hutár, Frank Schreiber, Lenka Pribusová Slušná, Martin Hodas, Jana Hrdá, Sigrid Bernstorff, M. Sojková, Ashin Shaji |
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Rok vydání: | 2021 |
Předmět: |
In situ
Materials science Condensed matter physics Scattering X-ray 02 engineering and technology Orientation (graph theory) 010402 general chemistry 021001 nanoscience & nanotechnology 01 natural sciences 0104 chemical sciences Surfaces Coatings and Films Electronic Optical and Magnetic Materials General Energy Physical and Theoretical Chemistry 0210 nano-technology Layer (electronics) Electronic properties |
Zdroj: | The Journal of Physical Chemistry C. 125:9461-9468 |
ISSN: | 1932-7455 1932-7447 |
Popis: | Some of the distinct optical, catalytical, and electronic properties of few-layer MoS2 films arise from a specific orientation of the MoS2 layers. The growth of horizontally or vertically aligned M... |
Databáze: | OpenAIRE |
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