Characterization of polyaniline thin films prepared on polyethylene terephthalate substrate
Autor: | M. M. Yatsyshyn, Yuliia Stetsiv, Ivan Saldan, Sergii A. Korniy, Oleksandr Reshetnyak, Dmytro Nykypanchuk, Tamara J. Bednarchuk |
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Rok vydání: | 2020 |
Předmět: |
Materials science
Polymers and Plastics Scanning electron microscope 02 engineering and technology General Chemistry Substrate (electronics) 010402 general chemistry 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences 0104 chemical sciences chemistry.chemical_compound Polymerization chemistry Chemical engineering Microscopy Polyaniline Materials Chemistry Polyethylene terephthalate Thin film Fourier transform infrared spectroscopy 0210 nano-technology |
Zdroj: | Polymer Bulletin. 78:6251-6265 |
ISSN: | 1436-2449 0170-0839 |
Popis: | The polyaniline thin films were prepared by in situ chemical polymerization of aniline on polyethylene terephthalate substrate in the aqueous solutions of citric acid with ammonium peroxydisulfate as oxidant. Using ultraviolet–visible and Fourier transform infrared spectroscopy, X-ray diffraction, scanning electron with energy-dispersive X-ray microscopy, atomic force microscopy, and four-point probe resistivity measurements, pure polyethylene terephthalate and polyaniline thin films were thoroughly characterized. Chemical analysis confirmed the formation of polyaniline with a high degree of oxidation in the form of a smooth thin film (with a thickness of ~ 80 ± 10 nm) on polyethylene terephthalate surface. However, delocalized polyaniline macromolecule aggregates in the spherical shape (with the diameter of ~ 30–40 nm) as well as in the irregular shape (the maximum size of ~ 300 nm) were found on the substrate. The values of average arithmetic roughness, average square roughness, asymmetry, kurtosis, average maximal profile height as well as average maximal height, and depth of roughness were calculated based on the atomic force microscopy data for pure polyethylene terephthalate and polyaniline thin films. |
Databáze: | OpenAIRE |
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