STM-excited and spectrally resolved luminescence of epitaxial GaN and AlGaN layers grown by MBE

Autor: E. Hartmann, T. Gabriel, A. Liebheit, M. Ortsiefer, M. Schwartzkopff, P. Radojkovic
Rok vydání: 1998
Předmět:
Zdroj: Applied Physics A: Materials Science & Processing. 66:S371-S375
ISSN: 1432-0630
0947-8396
Popis: cm-3, the background n-typecharacter can be overcompensated, giving rise to a pronounced radiative transition into the acceptor level located at ≈3.2 eV. The absolute peak intensities, however, markedly depend on the site of excitation at the sample surface. This effect allows to distinguish unequivocally between high-quality and defect-rich film regions, also offering the opportunity to correlate near-surface optical properties with morphological features. By adding 10% Al, the resulting crystal alloy exhibits a wider energy-band gap which is reflected in a blue shift of the respective STM-excited luminescence signal.
Databáze: OpenAIRE