| Popis: |
Currently, the contribution of electron microscopes for the diagnosis of diseases has significantly increased, including scanning electron microscopes (SEM) for studying the causes of diseases and the molecular-cellular mechanisms of the development of pathology. In this work, a mathematical model has been developed to obtain the current-voltage characteristic of a thermal-field emission Schottky cathode, which is exposed to external electric and magnetic fields. This mathematical model includes second-order differential equations of electron motion, Maxwell's equations, a modified Richardson-Dushman equation. The proposed model can be used for SEM modifications to improve the quality of images of biological objects and reduce the likelihood of artifacts at low accelerating voltages. |
