TID Response of an Analog In-Memory Neural Network Accelerator

Autor:	B. Tolleson, C. Bennett, T. Patrick Xiao, D. Wilson, J. Short, J. Kim, D. R. Hughart, N. Gilbert, S. Agarwal, H.J. Barnaby, M.J. Marinella
Rok vydání:	2023
Zdroj:	2023 IEEE International Reliability Physics Symposium (IRPS).
DOI:	10.1109/irps48203.2023.10118139
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::7809a028312ea777dee27c8c4333b584 https://doi.org/10.1109/irps48203.2023.10118139 Zobrazit plný text záznamu