Defect Diagnostic Matrix -a Defect Learning Vehicle For Submicron Technologies

Autor:	E.J. Sprogis, R.E. Newhart
Rok vydání:	2005
Předmět:	Very-large-scale integration Matrix (mathematics) Engineering Identification (information) Test site business.industry Pattern recognition (psychology) Electronic engineering Isolation (database systems) business
Zdroj:	Proceedings of the IEEE International Conference on Microelectronic Test Structures.
DOI:	10.1109/icmts.1988.672943
Popis:	This paper describes a defect monitoring test site that allows rapid isolation and identification of VLSI processing defects using functional test bit maps and pattern recognition programs. Some structural parts may be tested in-line.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::77e0d256dbc773e9f94cc7e4acde9b47 https://doi.org/10.1109/icmts.1988.672943 Zobrazit plný text záznamu