A comparative study of self-heating effects in 3nm node GAAFETs and FinFETs

Autor:	Pan Zhao, Song-Han Zhao, Yan-Dong He, Gang Du
Rok vydání:	2022
Zdroj:	2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT).
DOI:	10.1109/icsict55466.2022.9963426
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::77d095e115bcd9c1b79dec999e072539 https://doi.org/10.1109/icsict55466.2022.9963426 Zobrazit plný text záznamu