Contrast in X-ray section topographs of perfect silicon crystals using the Laue–Laue three-beam case of diffraction

Autor:	C. Eisenschmidt, H. R. Höche, Frank Heyroth
Rok vydání:	1999
Předmět:	Diffraction Physics Optics business.industry Dispersion (optics) X-ray Monochromatic color Radiation Structure factor Interference (wave propagation) business General Biochemistry Genetics and Molecular Biology Beam (structure)
Zdroj:	Journal of Applied Crystallography. 32:489-496
ISSN:	0021-8898
DOI:	10.1107/s002188989900240x
Popis:	Section topographs taken in three-beam diffraction geometry and in the neighbourhood of this geometric position are presented. The experiments were performed using polychromatic and monochromatic X-ray radiation. The interference of the two diffracted waves produces new contrast phenomena compared to the two-beam case. The contrast changes are discussed on the basis of the Bethe approximation by means of the effective structure factor and with regard to the dispersion surface of the three-beam case.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::77aeb3b2f0e6659b61067ff526add5e6 https://doi.org/10.1107/s002188989900240x Zobrazit plný text záznamu Plný text