TEM/SEM investigation of microstructural changes within the white etching area under rolling contact fatigue and 3-D crack reconstruction by focused ion beam
| Autor: | U. Ziese, Henny W. Zandbergen, A. Grabulov |
|---|---|
| Rok vydání: | 2007 |
| Předmět: |
Materials science
Recrystallization (geology) Scanning electron microscope Mechanical Engineering Metallurgy Metals and Alloys Condensed Matter Physics Focused ion beam Nanocrystalline material Mechanics of Materials Transmission electron microscopy Etching (microfabrication) Ferrite (iron) Martensite General Materials Science |
| Zdroj: | Scripta Materialia. 57:635-638 |
| ISSN: | 1359-6462 |
| Popis: | The white etching area (WEA) surrounding the cracks formed under high-cycle rolling contact fatigue was investigated by transmission electron microscopy (TEM) and Dual Beam (scanning electron microscopy (SEM)/focused ion beam). SEM revealed the initiation of cracks formed around artificially introduced Al2O3 inclusions in the model steel (composition similar to SAE 52100). TEM investigations showed a microstructural difference between the WEA (formation of nanocrystalline ferrite) and the steel matrix (tempered martensitic structure). A three-dimensional image of the crack reconstructed from ∼400 Dual Beam cross-section images is reported. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|
Full Text from ScienceDirect