The analysis fraktal characteristics of microscopic objects with WTMM method application

Autor:	Yu. P. Volkov, N.Yu. Khorovodova, N.V. Bespalova
Rok vydání:	2012
Předmět:	Fractal Optics business.industry Computer science Wavelet transform Pattern recognition Artificial intelligence business Object detection
Zdroj:	2012 International Conference on Actual Problems of Electron Devices Engineering.
DOI:	10.1109/apede.2012.6478093
Popis:	Article is devoted to research of fraktal characteristics of microscopic objects with WTMM method application. The assessment of multifraktal of studied images of surfaces is carried out.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::776b681c3c5fd681517d750affc5fb0d https://doi.org/10.1109/apede.2012.6478093 Zobrazit plný text záznamu