Proton Cross-Sections from Heavy-Ion Data in Deep-Submicron Technologies

Autor:	D. L. Hansen
Rok vydání:	2015
Předmět:	Physics Nuclear physics Nuclear and High Energy Physics Cross section (physics) Nuclear Energy and Engineering Proton Feature (computer vision) Heavy ion Semiconductor device Electrical and Electronic Engineering Nuclear Experiment Upset
Zdroj:	IEEE Transactions on Nuclear Science. 62:2874-2880
ISSN:	1558-1578 0018-9499
Popis:	This paper reports on the calculation of proton SEU cross section from heavy-ion data using a number of different models. Model accuracy is checked using data on proton and heavy-ion cross sections from the published literature. The closed-form models developed with earlier semiconductor devices typically overestimated the proton cross section, and the difference increased with smaller feature sizes. The results emphasize that low LET heavy-ion data is crucial in determining the proton upset cross section.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::76d5a3c75723423058a4a851e6629fb3 https://doi.org/10.1109/tns.2015.2482360 Zobrazit plný text záznamu