Temperature dependence of refractive index as a basis for laser thermometry of semiconductor crystals

Autor:	Alexander N. Magunov
Rok vydání:	1995
Předmět:	Materials science Basis (linear algebra) business.industry Optical engineering Physics::Optics Laser law.invention Crystal Depth sounding Semiconductor Optics law business Refractive index Laser beams
Zdroj:	Refractometry.
ISSN:	0277-786X
DOI:	10.1117/12.213174
Popis:	The quantitative description of interferogram registered in heating of crystal which has a finite angle between two surfaces and irradiating of crystal with sounding laser beam is given. The possibility of continuous measurement in real time of crystal's temperature using imperfect interferogram is discussed.© (1995) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Databáze:	OpenAIRE
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