All-Digital Duty-Cycle Corrector With a Wide Duty Correction Range for DRAM Applications

Autor: In-Chul Hwang, Chan-Hui Jeong, Soo-Won Kim, Ammar Abdullah, Young-Jae Min
Rok vydání: 2016
Předmět:
Zdroj: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 24:363-367
ISSN: 1557-9999
1063-8210
Popis: An all-digital duty-cycle corrector with a wide duty correction range and fast correction time is hereby presented. The proposed corrector uses a 1-bit digital duty-cycle detector with a time-to-digital converter, and it achieves a duty correction range between 10% and 90% with a low pressure, volume, and temperature variation. The test chip was fabricated using a 0.13- $\mu $ m CMOS process, and it occupies an area of 0.059 mm $^{2}$ . The correction cycle is a 14 cycles and the duty-cycle error is below ±1.4%. At an operating frequency of 1 GHz, the power dissipation and peak-to-peak jitter are measured at 5.6 mW and 20.5 ps, respectively.
Databáze: OpenAIRE