Tools and Approaches for Assembly, Review, and Analysis of Large-Scale Electron Microscopy

Autor:	Crystal Sigulinsky, James R. Anderson, Rebecca L. Pfeiffer, Bryan W. Jones
Rok vydání:	2021
Předmět:	Scale (ratio) Computer science law Nanotechnology Electron microscope Instrumentation law.invention
Zdroj:	Microscopy and Microanalysis. 27:3042-3044
ISSN:	1435-8115 1431-9276
DOI:	10.1017/s1431927621010552
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::7639a1c20f7563496c62a86cda7162d0 https://doi.org/10.1017/s1431927621010552 Zobrazit plný text záznamu