Ion-induced sustained high current condition in a bipolar device
| Autor: | T.K. Tsubota, D.E. Romeo, D.J. Mabry, R. Koga, R.J. Ferro, J. R. Scarpulla, S.D. Pinkerton, M. Shoga |
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| Rok vydání: | 1994 |
| Předmět: |
Nuclear and High Energy Physics
Materials science business.industry Electrical engineering Mechanism based Integrated circuit Ion law.invention Reliability (semiconductor) Nuclear Energy and Engineering Single event upset law Optoelectronics High current Electrical and Electronic Engineering Electric current Anomaly (physics) business |
| Zdroj: | IEEE Transactions on Nuclear Science. 41:2172-2178 |
| ISSN: | 1558-1578 0018-9499 |
| Popis: | Observation of an ion-induced sustained high current condition ("high current anomaly") in a bipolar device, that is similar but not identical to latchup, is reported. Both high current anomaly and single event upset test results are presented for the AD9048 test device. Photon emission microscopy was used to locate the site of the high current anomaly. A model of the triggering mechanism based on the results so obtained is described. > |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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