Ion-sensitive field-effect transistors in standard CMOS fabricated by post processing
| Autor: | Uri Dinnar, M. Feinsod, C.G. Jakobson, Yael Nemirovsky |
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| Rok vydání: | 2002 |
| Předmět: |
Materials science
business.industry Transistor Electrical engineering Hardware_PERFORMANCEANDRELIABILITY Integrated circuit design Chip law.invention Integrated injection logic CMOS law Gate oxide Hardware_INTEGRATEDCIRCUITS Optoelectronics Field-effect transistor Electrical and Electronic Engineering ISFET business Instrumentation Hardware_LOGICDESIGN |
| Zdroj: | IEEE Sensors Journal. 2:279-287 |
| ISSN: | 1530-437X |
| Popis: | Highly integrated ion-sensitive field-effect transistor (ISFET) microsystems require the monolithic implementation of ISFETs, CMOS electronics, and additional sensors on the same chip. This paper presents new ISFETs in standard CMOS, fabricated by post-processing of a standard CMOS VLSI chip. Unlike CMOS compatible ISFETs fabricated in a dedicated process, the new sensors are directly combined with state-of-the-art CMOS electronics and are subject to continuous technology upgrading. The ISFETs presented include an intermediate gate formed by one or more conducting layers placed between the gate oxide and the sensing layer. The combination of the highly isolating gate oxide of the MOS with a leaky or conducting sensing layer allows the use of low temperature materials that do not damage the CMOS chip. The operation of ISFETs with an intermediate gate and sensing layers fabricated at low temperature is modeled. ISFETs with a linear pH response and drift as low as 0.3 mV/h are reported. |
| Databáze: | OpenAIRE |
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