All-Silicon Photodetectors for Photonic Integrated Circuit Calibration
| Autor: | Jon Oyvind Kjellman, Aleks Marinins, Tangla David, Edward Van Sieleghem, Sarvagya Dwivedi, Philippe Soussan, Olga Syshchyk, Mathias Prost, Marcus S. Dahlem, Xavier Rottenberg, Roelof Jansen, Jiwon Lee |
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| Rok vydání: | 2021 |
| Předmět: |
Materials science
Physics::Instrumentation and Detectors business.industry Doping Photonic integrated circuit Physics::Optics Photodetector Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Responsivity Calibration Optoelectronics Electrical and Electronic Engineering Photonics business p–n junction Dark current |
| Zdroj: | IEEE Photonics Technology Letters. 33:836-839 |
| ISSN: | 1941-0174 1041-1135 |
| Popis: | All-silicon highly-doped PN junction-based photodetectors, for photonic integrated circuit (PIC) calibration and power monitoring, are designed and fabricated in the C-band. The photodetector response is measured for different doping conditions. The photodetectors are integrated with an interferometric based phase-interrogator structure for a test calibration circuit. The measured devices show high responsivity (12 A/W) obtained under avalanche condition at 5.7 V reverse bias and reasonable dark current ( $1~\mu \text{A}$ ) due to photon assisted tunneling effect and are therefore, proved to be an ideal candidate for power monitoring and phase calibration of PICs. |
| Databáze: | OpenAIRE |
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