The IEEE Technical Committee 10: The Waveform Generation, Measurement, and Analysis Committee

Autor: Jerome J. Blair, John Jendzursk, Luca De Vito, W. B. Boyer, Sergio Rapuano, Nicholas G. Paulter
Rok vydání: 2021
Předmět:
Zdroj: IEEE Instrumentation & Measurement Magazine. 24:7-10
ISSN: 1941-0123
1094-6969
Popis: The IEEE Technical Committee 10 (TC-10), the Waveform Generation, Measurement, and Analysis Committee of the IEEE Instrumentation and Measurement (IM IEEE Std 1057–2017, Standard for Digitizing Waveform Recorders [2]; IEEE Std 1241–2010, Standard for Terminology and Test Methods for Ana-log-to-Digital Converters [3]; IEEE Std 658–2011, Standard for Terminology and Test Methods for Digital-to-Analog Converters [4]; the IEEE Std 1696–2013, Standard for Terminology and Test Methods for Circuit Probes [5]; and the IEEE Std 2414–2020, Standard for Jitter and Phase Noise [6]. Additional information on these standards can be found in [7].
Databáze: OpenAIRE