| Autor: |
S. P. Zemtsov, I. G. Kvitkova, I.B. Elistratova, I. V. Yakimova, Yu.A. Palchun |
| Rok vydání: |
2012 |
| Předmět: |
|
| Zdroj: |
2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE). |
| DOI: |
10.1109/apeie.2012.6628959 |
| Popis: |
Graphical representation of systems of metrological procurement and production control is based on using structure diagram where elements have 2n poles. These elements can be represented as directed graphs. To obtain graphical models one can use S-graph structures based on scattering matrices. The matrices contain all information on the system behavior, satisfy probabilities normalization requirement and causality principle. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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