Deep Cryogenic Temperature TDDB in 45-nm PDSOI N-channel FETs for Quantum Computing Applications
Autor: | Asifa Amin, Aarti Rathi, Sujit K. Singh, Abhisek Dixit, Oscar H. Gonzalez, P. Srinivasan, Fernando Guarin |
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Rok vydání: | 2022 |
Zdroj: | 2022 IEEE International Reliability Physics Symposium (IRPS). |
DOI: | 10.1109/irps48227.2022.9764493 |
Databáze: | OpenAIRE |
Externí odkaz: |