Deep Cryogenic Temperature TDDB in 45-nm PDSOI N-channel FETs for Quantum Computing Applications

Autor: Asifa Amin, Aarti Rathi, Sujit K. Singh, Abhisek Dixit, Oscar H. Gonzalez, P. Srinivasan, Fernando Guarin
Rok vydání: 2022
Zdroj: 2022 IEEE International Reliability Physics Symposium (IRPS).
DOI: 10.1109/irps48227.2022.9764493
Databáze: OpenAIRE