Computing refractive index of materials from thin film optical properties

Autor:	T. Hoshino, J. B. Cole, S. Banerjee, S. Aoki, M. Itoh
Rok vydání:	2018
Předmět:	010309 optics Materials science business.industry 0103 physical sciences Optoelectronics 02 engineering and technology Thin film 021001 nanoscience & nanotechnology 0210 nano-technology business 01 natural sciences Refractive index
Zdroj:	2018 Joint Symposia on Optics.
DOI:	10.1364/opj.2018.30pbj5
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::7589fc0e115b7db5650a4d102cd52fe3 https://doi.org/10.1364/opj.2018.30pbj5 Zobrazit plný text záznamu