| Autor: |
Scott A. Cabelli, John D. Blackwell, D. D. Edwall, William E. Tennant, Steven G. Bernd, E. Piquette, J. G. Pasko, Jianmei Pan, S. Bhargava |
| Rok vydání: |
2003 |
| Předmět: |
|
| Zdroj: |
SPIE Proceedings. |
| ISSN: |
0277-786X |
| DOI: |
10.1117/12.488517 |
| Popis: |
A High Resolution Near-Infrared (NIR) Camera has been developed and tested. This NIR camera uses a HgCdTe detector array which allows for imaging at high operating temperatures. The camera's format is 640x512 pixels with an 18 μm pitch. We have obtained high broadband spectral response from 0.9 to 2.0 micron with near 100% optical fill factor. The camera is designed as a turnkey system that uses the industry standard Camera Link digital interface. The electronics are located remotely from the sensor head allowing it to be adapted to existing optical systems. This compact camera has been targeted for military, scientific and telecommunication applications. This paper will detail the measured camera performance. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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