Evaluation of Crystal Lattice Rotation around a Stress-Induced Twin in a Step-Graded SiGe / Si (110) Using STEM Moiré Observation and its Image Analysis

Autor:	Junji Yamanaka, Kosuke O. Hara, Mai Shirakura, Keisuke Arimoto, Kazuo Ishizuka, Akimitsu Ishizuka, Kiyokazu Nakagawa, Chiaya Yamamoto
Rok vydání:	2019
Předmět:	Optics Materials science business.industry Stress induced Crystal structure Moiré pattern business Rotation Instrumentation Image (mathematics)
Zdroj:	Microscopy and Microanalysis. 25:242-243
ISSN:	1435-8115 1431-9276
DOI:	10.1017/s1431927619001946
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::74bee7455900aedbd825f930b269c022 https://doi.org/10.1017/s1431927619001946 Zobrazit plný text záznamu